Usage Scenarios



Plasma dicing removes wafer boundary materials in a plasma dry etching environment using reactive gases (typically SF₆ / CF₄).
Since no mechanical stress is applied during plasma dicing, it effectively reduces chipping, micro-cracks, thermal damage, and edge breakage,
providing significant advantages for ultra-thin wafers (<50 μm) and high-brittleness materials such as Si, SiC, GaAs, and glass.


| Item | AWD79L | |
| pH | 7.0 ± 0.5 | |
| Viscosity (cP) | 100 ± 50 | |
| T.I. | - | |
| Conductivity (mS/cm) | - | |
| S.C.(%)-1.5 h | 25 ± 5 | |
| Absorbance(@355 nm) | 60 | |
| T% | 85 | |
| Haze (%) | 2 | |
| Lab | L* | 93 |
| a* | - | |
| b* | - | |
| Appearance | Pale yellow liquid | |
5 L and 20 L HDPE Containers
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